Author: Gofron, K.J.
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WEBPL02 On-Axis 3D Microscope for X-Ray Beamlines at NSLS-II 1048
  • K.J. Gofron, Y.Q. Cai
    BNL, Upton, Long Island, New York, USA
  • J. Wlodek
    Stony Brook University, Computer Science Department, Stony Brook, New York, USA
  Funding: Work supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract No. DE-SC0012704.
A series of versatile on-axis X-ray microscopes with large working distances, high resolution and large magnification have been developed for in-situ sample alignment and X-ray beam visualization at beam-lines at NSLS-II [1]. The microscopes use reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.) [2]. Currently over seven reflective microscopes have been procured with several installed at NSLS2 beam-lines. Additional customizations can be implemented providing for example dual-view with high/low magnification, 3-D imaging, long working range, as well as ruby pressure system measurement. The microscope camera control frequently utilizes EPICS areaDetector. In specialized applications python programs integrate EPICS camera control, with computer vision, and EPICS motion control for goniostat centering or object detection applications.
[1] K. J. Gofron, et. al.; AIP Conf. Proc. 1741, 030027-1-030027-4; doi: 10.1063/1.4952850.
[2] K. J. Gofron, et. al., Nucl. Instr. and Meth. A 649, 109 (2011).
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