Keyword: ion-effects
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THPHA031 Fast Image Analysis for Beam Profile Measurement at the European XFEL ion, FEL, emittance, electron 1416
  • J. Wilgen, B. Beutner
    DESY, Hamburg, Germany
  At the European XFEL, images of scintillator screens are processed at a rate of 10 Hz. Dedicated image analysis servers are used for transversal beam profile analysis as well as for longitudinal profile and slice emittance measurement. This contribution describes the setup and the algorithms used for image analysis.  
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